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Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation

Bibliographic Details
Title: Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation
Authors: Yao, Bo, Wang, Zhaoxin, Wei, Xing, Zhang, Yichi, Qi, Lei, Wang, Huai
Source: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-5 May, 2026
Relation: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia)
Database: IEEE Xplore Digital Library
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  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11597350
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AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1160.61413574219
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Yao%2C+Bo%22">Yao, Bo</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Zhaoxin%22">Wang, Zhaoxin</searchLink><br /><searchLink fieldCode="AR" term="%22Wei%2C+Xing%22">Wei, Xing</searchLink><br /><searchLink fieldCode="AR" term="%22Zhang%2C+Yichi%22">Zhang, Yichi</searchLink><br /><searchLink fieldCode="AR" term="%22Qi%2C+Lei%22">Qi, Lei</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Huai%22">Wang, Huai</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-5 May, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11597350
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.23919/IPEC-Nagasaki2026-EC64663.2026.11597350
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 1
    Titles:
      – TitleFull: Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Yao, Bo
      – PersonEntity:
          Name:
            NameFull: Wang, Zhaoxin
      – PersonEntity:
          Name:
            NameFull: Wei, Xing
      – PersonEntity:
          Name:
            NameFull: Zhang, Yichi
      – PersonEntity:
          Name:
            NameFull: Qi, Lei
      – PersonEntity:
          Name:
            NameFull: Wang, Huai
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 31
              M: 05
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9784886864475
            – Type: isbn-print
              Value: 9798331557287
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia), Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International
              Type: main
ResultId 1