Yao, B., Wang, Z., Wei, X., Zhang, Y., Qi, L., & Wang, H. (2026). Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation. 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia), Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International, 1. https://doi.org/10.23919/IPEC-Nagasaki2026-EC64663.2026.11597350
Παραπομπή σε μορφή Chicago (17η εκδ.)Yao, Bo, Zhaoxin Wang, Xing Wei, Yichi Zhang, Lei Qi, και Huai Wang. "Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation." 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia), Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International 2026: 1. https://doi.org/10.23919/IPEC-Nagasaki2026-EC64663.2026.11597350.
Παραπομπή σε μορφή MLA (9th εκδ.)Yao, Bo, et al. "Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation." 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia), Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International, 2026, p. 1, https://doi.org/10.23919/IPEC-Nagasaki2026-EC64663.2026.11597350.