Tu, K., Kang, J., Liu, L., Hu, J., Duan, T., Shan, T., . . . Wu, Y. (2026). A Novel Testing Method for Solid-State Current Limiters Based on the Constant DC Source. 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM), DC Microgrids (ICDCM), 2026 IEEE Eighth International Conference on, 1. https://doi.org/10.1109/ICDCM67837.2026.11594614
Παραπομπή σε μορφή Chicago (17η εκδ.)Tu, Kai, Jiaming Kang, Li Liu, Junhua Hu, Tianyuan Duan, Tianpei Shan, Yu Xiao, και Yifei Wu. "A Novel Testing Method for Solid-State Current Limiters Based on the Constant DC Source." 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM), DC Microgrids (ICDCM), 2026 IEEE Eighth International Conference on 2026: 1. https://doi.org/10.1109/ICDCM67837.2026.11594614.
Παραπομπή σε μορφή MLA (9th εκδ.)Tu, Kai, et al. "A Novel Testing Method for Solid-State Current Limiters Based on the Constant DC Source." 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM), DC Microgrids (ICDCM), 2026 IEEE Eighth International Conference on, 2026, p. 1, https://doi.org/10.1109/ICDCM67837.2026.11594614.