Conference
EEG-Based Stress Analysis in Students During Skill Assessment Using Machine Learning Algorithms
| Τίτλος: | EEG-Based Stress Analysis in Students During Skill Assessment Using Machine Learning Algorithms |
|---|---|
| Συγγραφείς: | Vytheeswar, P, Bhat, Devadas, Kubakaddi, Sanjeev, Hariharan, Hema |
| Πηγή: | 2026 International Conference on Next Generation Electronics (NELEX) Next Generation Electronics (NELEX), 2026 International Conference on. :1-6 May, 2026 |
| Relation: | 2026 International Conference on Next Generation Electronics (NELEX) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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