Vytheeswar, P., Bhat, D., Kubakaddi, S., & Hariharan, H. (2026). EEG-Based Stress Analysis in Students During Skill Assessment Using Machine Learning Algorithms. 2026 International Conference on Next Generation Electronics (NELEX), Next Generation Electronics (NELEX), 2026 International Conference on, 1. https://doi.org/10.1109/NELeX69209.2026.11590098
Παραπομπή σε μορφή Chicago (17η εκδ.)Vytheeswar, P., Devadas Bhat, Sanjeev Kubakaddi, και Hema Hariharan. "EEG-Based Stress Analysis in Students During Skill Assessment Using Machine Learning Algorithms." 2026 International Conference on Next Generation Electronics (NELEX), Next Generation Electronics (NELEX), 2026 International Conference on 2026: 1. https://doi.org/10.1109/NELeX69209.2026.11590098.
Παραπομπή σε μορφή MLA (9th εκδ.)Vytheeswar, P., et al. "EEG-Based Stress Analysis in Students During Skill Assessment Using Machine Learning Algorithms." 2026 International Conference on Next Generation Electronics (NELEX), Next Generation Electronics (NELEX), 2026 International Conference on, 2026, p. 1, https://doi.org/10.1109/NELeX69209.2026.11590098.