Lone, M., Sahoo, D., & Manhas, S. (2026). 3D NAND Scaling Performance Enhancement Using 2D MoS2 Channel. IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib., 26(3), 815-821. https://doi.org/10.1109/TDMR.2026.3697549
Παραπομπή σε μορφή Chicago (17η εκδ.)Lone, M.A, D. Sahoo, και S.K Manhas. "3D NAND Scaling Performance Enhancement Using 2D MoS2 Channel." IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib. 26, no. 3 (2026): 815-821. https://doi.org/10.1109/TDMR.2026.3697549.
Παραπομπή σε μορφή MLA (9th εκδ.)Lone, M.A, et al. "3D NAND Scaling Performance Enhancement Using 2D MoS2 Channel." IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib., vol. 26, no. 3, 2026, pp. 815-821, https://doi.org/10.1109/TDMR.2026.3697549.