Investigation of Linearity Performance in p-GaN Gate Enhancement-Mode High Electron Mobility Transistor

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Investigation of Linearity Performance in p-GaN Gate Enhancement-Mode High Electron Mobility Transistor
Συγγραφείς: Sharma, Nipun, Raman, Ashish, Kumar, Pankaj, Hamid, Sahil, Kumar, Mohit
Πηγή: 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER) Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), 2026 International Conference on. :1-4 Feb, 2026
Relation: 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER)
Βάση Δεδομένων: IEEE Xplore Digital Library