Conference

A Comprehensive Study of Channel Height and Spacer Length Scaling in Nanosheet Field-Effect Transistors

Bibliographic Details
Title: A Comprehensive Study of Channel Height and Spacer Length Scaling in Nanosheet Field-Effect Transistors
Authors: Reddy, Chinta Rahul, Yadav, Dharmendra Singh
Source: 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER) Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), 2026 International Conference on. :1-5 Feb, 2026
Relation: 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER)
Database: IEEE Xplore Digital Library
Description
ISBN:9798331551841
9798331551858
DOI:10.1109/CIPHER70417.2026.11523975