Reddy, C. R., & Yadav, D. S. (2026). A Comprehensive Study of Channel Height and Spacer Length Scaling in Nanosheet Field-Effect Transistors. 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), 2026 International Conference on, 1. https://doi.org/10.1109/CIPHER70417.2026.11523975
Παραπομπή σε μορφή Chicago (17η εκδ.)Reddy, Chinta Rahul, και Dharmendra Singh Yadav. "A Comprehensive Study of Channel Height and Spacer Length Scaling in Nanosheet Field-Effect Transistors." 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), 2026 International Conference on 2026: 1. https://doi.org/10.1109/CIPHER70417.2026.11523975.
Παραπομπή σε μορφή MLA (9th εκδ.)Reddy, Chinta Rahul, και Dharmendra Singh Yadav. "A Comprehensive Study of Channel Height and Spacer Length Scaling in Nanosheet Field-Effect Transistors." 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER), 2026 International Conference on, 2026, p. 1, https://doi.org/10.1109/CIPHER70417.2026.11523975.