Ha, H., Kim, D., Kwon, O., Seo, Y., & Hwang, H. (2026). Oxygen-Stoichiometry-Controlled Linearity and Uniformity of W/WOx/W Fixed-Resistance Arrays for Edge-AI Inference. IEEE Electron Device Letters, Electron Device Letters, IEEE, IEEE Electron Device Lett., 47(7), 1358. https://doi.org/10.1109/LED.2026.3691110
Παραπομπή σε μορφή Chicago (17η εκδ.)Ha, H., D. Kim, O. Kwon, Y. Seo, και H. Hwang. "Oxygen-Stoichiometry-Controlled Linearity and Uniformity of W/WOx/W Fixed-Resistance Arrays for Edge-AI Inference." IEEE Electron Device Letters, Electron Device Letters, IEEE, IEEE Electron Device Lett. 47, no. 7 (2026): 1358. https://doi.org/10.1109/LED.2026.3691110.
Παραπομπή σε μορφή MLA (9th εκδ.)Ha, H., et al. "Oxygen-Stoichiometry-Controlled Linearity and Uniformity of W/WOx/W Fixed-Resistance Arrays for Edge-AI Inference." IEEE Electron Device Letters, Electron Device Letters, IEEE, IEEE Electron Device Lett., vol. 47, no. 7, 2026, p. 1358, https://doi.org/10.1109/LED.2026.3691110.