Conference
EVM Testing Method for Programmable RF Transceivers
| Τίτλος: | EVM Testing Method for Programmable RF Transceivers |
|---|---|
| Συγγραφείς: | Lin, Shuheng, Li, Xuewu, Zhang, Cenyue, Zhang, Fan, Zeng, Lang |
| Πηγή: | 2026 IEEE 8th International Conference on Communications, Information System and Computer Engineering (CISCE) Communications, Information System and Computer Engineering (CISCE), 2026 IEEE 8th International Conference on. :93-99 Mar, 2026 |
| Relation: | 2026 IEEE 8th International Conference on Communications, Information System and Computer Engineering (CISCE) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11504657 RelevancyScore: 1145 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1144.83898925781 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11504657 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/CISCE69494.2026.11504657 PhysicalDescription: Pagination: PageCount: 7 StartPage: 93 Titles: – TitleFull: EVM Testing Method for Programmable RF Transceivers Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lin, Shuheng – PersonEntity: Name: NameFull: Li, Xuewu – PersonEntity: Name: NameFull: Zhang, Cenyue – PersonEntity: Name: NameFull: Zhang, Fan – PersonEntity: Name: NameFull: Zeng, Lang IsPartOfRelationships: – BibEntity: Dates: – D: 27 M: 03 Type: published Y: 2026 Identifiers: – Type: isbn-print Value: 9798331560423 – Type: isbn-print Value: 9798331560416 – Type: isbn-print Value: 9798331560430 – Type: issn-print Value: 28332423 – Type: issn-print Value: 28332415 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2026 IEEE 8th International Conference on Communications, Information System and Computer Engineering (CISCE), Communications, Information System and Computer Engineering (CISCE), 2026 IEEE 8th International Conference on Type: main |
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