Improved Electrical Stress Reliability and Breakdown in MoS2 FETs by Se-Alloying - Dar, Aadil Bashir; Andrabi, S Tehmeena; Yadav, Megha; Shah, Asif A; Rai, Anand K; B M, R Archana; Verma, Rupali; Patbhaje, Utpreksh; Shrivastava, Mayank (2026 IEEE International Reliability Physics Symposium (IRPS), Reliability Physics Symposium (IRPS), 2026 IEEE International, 2026)