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High-k scaling for reliability enhancement in 300-mm-integrated WS2 FETs

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Τίτλος: High-k scaling for reliability enhancement in 300-mm-integrated WS2 FETs
Συγγραφείς: Panarella, Luca, Tyaginov, Stanislav, Smets, Quentin, Kaczer, Ben, Schram, Tom, Cott, Daire, De La Rosa, Cesar Javier Lockhart, Sankar Kar, Gouri, Afanas'Ev, Valeri
Πηγή: 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026
Relation: 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11497294
RelevancyScore: 1132
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1132.33544921875
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: High-k scaling for reliability enhancement in 300-mm-integrated WS2 FETs
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Panarella%2C+Luca%22">Panarella, Luca</searchLink><br /><searchLink fieldCode="AR" term="%22Tyaginov%2C+Stanislav%22">Tyaginov, Stanislav</searchLink><br /><searchLink fieldCode="AR" term="%22Smets%2C+Quentin%22">Smets, Quentin</searchLink><br /><searchLink fieldCode="AR" term="%22Kaczer%2C+Ben%22">Kaczer, Ben</searchLink><br /><searchLink fieldCode="AR" term="%22Schram%2C+Tom%22">Schram, Tom</searchLink><br /><searchLink fieldCode="AR" term="%22Cott%2C+Daire%22">Cott, Daire</searchLink><br /><searchLink fieldCode="AR" term="%22De+La+Rosa%2C+Cesar+Javier+Lockhart%22">De La Rosa, Cesar Javier Lockhart</searchLink><br /><searchLink fieldCode="AR" term="%22Sankar+Kar%2C+Gouri%22">Sankar Kar, Gouri</searchLink><br /><searchLink fieldCode="AR" term="%22Afanas'Ev%2C+Valeri%22">Afanas'Ev, Valeri</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11497294
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/EDTM65772.2026.11497294
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 1
    Titles:
      – TitleFull: High-k scaling for reliability enhancement in 300-mm-integrated WS2 FETs
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Panarella, Luca
      – PersonEntity:
          Name:
            NameFull: Tyaginov, Stanislav
      – PersonEntity:
          Name:
            NameFull: Smets, Quentin
      – PersonEntity:
          Name:
            NameFull: Kaczer, Ben
      – PersonEntity:
          Name:
            NameFull: Schram, Tom
      – PersonEntity:
          Name:
            NameFull: Cott, Daire
      – PersonEntity:
          Name:
            NameFull: De La Rosa, Cesar Javier Lockhart
      – PersonEntity:
          Name:
            NameFull: Sankar Kar, Gouri
      – PersonEntity:
          Name:
            NameFull: Afanas'Ev, Valeri
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798331585983
            – Type: isbn-print
              Value: 9798331585990
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE
              Type: main
ResultId 1