Kari, M., & Chandrashekar, P. (2026). A Predictive Machine Learning Approach for Enhancing Software Testing Efficiency with Automated Defect Prediction. 2026 World Conference on Computational Science and Technology (WcCST), Computational Science and Technology (WcCST), 2026 World Conference on, 592. https://doi.org/10.1109/WcCST67302.2026.11496032
Παραπομπή σε μορφή Chicago (17η εκδ.)Kari, Mahathi, και Pooja Chandrashekar. "A Predictive Machine Learning Approach for Enhancing Software Testing Efficiency with Automated Defect Prediction." 2026 World Conference on Computational Science and Technology (WcCST), Computational Science and Technology (WcCST), 2026 World Conference on 2026: 592. https://doi.org/10.1109/WcCST67302.2026.11496032.
Παραπομπή σε μορφή MLA (9th εκδ.)Kari, Mahathi, και Pooja Chandrashekar. "A Predictive Machine Learning Approach for Enhancing Software Testing Efficiency with Automated Defect Prediction." 2026 World Conference on Computational Science and Technology (WcCST), Computational Science and Technology (WcCST), 2026 World Conference on, 2026, p. 592, https://doi.org/10.1109/WcCST67302.2026.11496032.