Roodsari, M., Meyers, V., & Tahoori, M. (2026). SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing. IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib., 26(3), 771-779. https://doi.org/10.1109/TDMR.2026.3685392
Παραπομπή σε μορφή Chicago (17η εκδ.)Roodsari, M.S, V. Meyers, και M. Tahoori. "SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing." IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib. 26, no. 3 (2026): 771-779. https://doi.org/10.1109/TDMR.2026.3685392.
Παραπομπή σε μορφή MLA (9th εκδ.)Roodsari, M.S, et al. "SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing." IEEE Transactions on Device and Materials Reliability, Device and Materials Reliability, IEEE Transactions on, IEEE Trans. Device Mater. Relib., vol. 26, no. 3, 2026, pp. 771-779, https://doi.org/10.1109/TDMR.2026.3685392.