Academic Journal
A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules
| Τίτλος: | A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules |
|---|---|
| Συγγραφείς: | Dou, Z., Dou, H., Ma, Y., Mao, X., Lu, F., Liu, H., Wang, Q. |
| Πηγή: | IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 14(5):6090-6103 Oct, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://resolver.ebsco.com/c/fiv2js/result?sid=EBSCO:edseee&genre=article&issn=21686777&ISBN=&volume=14&issue=5&date=20261001&spage=6090&pages=6090-6103&title=IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron.&atitle=A%20Deep%20Learning-Based%20Parametric%20Fault%20Diagnosis%20Method%20for%20Metallized%20Polypropylene%20Film%20Capacitors%20in%20MMC%20Submodules&aulast=Dou%2C%20Z.&id=DOI:10.1109/JESTPE.2026.3683917 Name: Full Text Finder (for New FTF UI) (ns324271) Category: fullText Text: Full Text Finder MouseOverText: Full Text Finder |
|---|---|
| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11481055 RelevancyScore: 1163 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 1162.99951171875 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Dou%2C+Z%2E%22">Dou, Z.</searchLink><br /><searchLink fieldCode="AR" term="%22Dou%2C+H%2E%22">Dou, H.</searchLink><br /><searchLink fieldCode="AR" term="%22Ma%2C+Y%2E%22">Ma, Y.</searchLink><br /><searchLink fieldCode="AR" term="%22Mao%2C+X%2E%22">Mao, X.</searchLink><br /><searchLink fieldCode="AR" term="%22Lu%2C+F%2E%22">Lu, F.</searchLink><br /><searchLink fieldCode="AR" term="%22Liu%2C+H%2E%22">Liu, H.</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Q%2E%22">Wang, Q.</searchLink> – Name: TitleSource Label: Source Group: Src Data: IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 14(5):6090-6103 Oct, 2026 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11481055 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/JESTPE.2026.3683917 PhysicalDescription: Pagination: PageCount: 14 StartPage: 6090 Titles: – TitleFull: A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Dou, Z. – PersonEntity: Name: NameFull: Dou, H. – PersonEntity: Name: NameFull: Ma, Y. – PersonEntity: Name: NameFull: Mao, X. – PersonEntity: Name: NameFull: Lu, F. – PersonEntity: Name: NameFull: Liu, H. – PersonEntity: Name: NameFull: Wang, Q. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 21686777 – Type: issn-print Value: 21686785 – Type: issn-locals Value: edseee.IEEEJournals Numbering: – Type: volume Value: 14 – Type: issue Value: 5 Titles: – TitleFull: IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron. Type: main |
| ResultId | 1 |