Dou, Z., Dou, H., Ma, Y., Mao, X., Lu, F., Liu, H., & Wang, Q. (2026). A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules. IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron., 14(5), 6090-6103. https://doi.org/10.1109/JESTPE.2026.3683917
Chicago Style (17th ed.) CitationDou, Z., H. Dou, Y. Ma, X. Mao, F. Lu, H. Liu, and Q. Wang. "A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules." IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron. 14, no. 5 (2026): 6090-6103. https://doi.org/10.1109/JESTPE.2026.3683917.
MLA (9th ed.) CitationDou, Z., et al. "A Deep Learning-Based Parametric Fault Diagnosis Method for Metallized Polypropylene Film Capacitors in MMC Submodules." IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron., vol. 14, no. 5, 2026, pp. 6090-6103, https://doi.org/10.1109/JESTPE.2026.3683917.