Li, J., Li, L., Dong, Y., Xie, H., & Qin, S. (2026). Transformer-Based Missing Data Imputation in Time Series With Application to Flight Test Data. IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron., 73(9), 13788-13800. https://doi.org/10.1109/TIE.2026.3672736
Παραπομπή σε μορφή Chicago (17η εκδ.)Li, J., L. Li, Y. Dong, H. Xie, και S.J Qin. "Transformer-Based Missing Data Imputation in Time Series With Application to Flight Test Data." IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron. 73, no. 9 (2026): 13788-13800. https://doi.org/10.1109/TIE.2026.3672736.
Παραπομπή σε μορφή MLA (9th εκδ.)Li, J., et al. "Transformer-Based Missing Data Imputation in Time Series With Application to Flight Test Data." IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron., vol. 73, no. 9, 2026, pp. 13788-13800, https://doi.org/10.1109/TIE.2026.3672736.