Academic Journal
A 1.8-to-3.0-GHz Fully Integrated All-in-One CMOS Frequency Management Module Achieving −47-/+42-ppm Inaccuracy From −40 ∘C to 95 ∘C and −150/+70 ppm After Accelerated Aging
| Τίτλος: | A 1.8-to-3.0-GHz Fully Integrated All-in-One CMOS Frequency Management Module Achieving −47-/+42-ppm Inaccuracy From −40 ∘C to 95 ∘C and −150/+70 ppm After Accelerated Aging |
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| Συγγραφείς: | Huo, R., Zhang, T., Jie, W., Zheng, Y., Li, D., Zhang, Y., Gao, L., Zhao, Y., Li, Y., Jiang, H., You, M., Liu, J., Mercier, P.P., Wang, H. |
| Πηγή: | IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 61(9):4649-4663 Sep, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00189200 1558173X |
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| DOI: | 10.1109/JSSC.2026.3677418 |