Conference
Προβολή σε EDS

Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions
Συγγραφείς: Seo, Hyeona, Kim, Geon, Kim, Dongyeong, Kim, Suyeon, Park, Jewon, Kim, Shinwook, Kang, Ryun, Kim, Sowon, Lim, Chaehyuk, Yun, Jeonghyeon, Lee, Juwon, Lee, Hyerin, Choi, Ujin, Kim, Eojin, Jeong, Minwoo, Lee, Myoungjin
Πηγή: 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on. :019-021 Feb, 2026
Relation: 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)
Βάση Δεδομένων: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11454201
RelevancyScore: 1132
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1132.32531738281
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Seo%2C+Hyeona%22">Seo, Hyeona</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Geon%22">Kim, Geon</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Dongyeong%22">Kim, Dongyeong</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Suyeon%22">Kim, Suyeon</searchLink><br /><searchLink fieldCode="AR" term="%22Park%2C+Jewon%22">Park, Jewon</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Shinwook%22">Kim, Shinwook</searchLink><br /><searchLink fieldCode="AR" term="%22Kang%2C+Ryun%22">Kang, Ryun</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Sowon%22">Kim, Sowon</searchLink><br /><searchLink fieldCode="AR" term="%22Lim%2C+Chaehyuk%22">Lim, Chaehyuk</searchLink><br /><searchLink fieldCode="AR" term="%22Yun%2C+Jeonghyeon%22">Yun, Jeonghyeon</searchLink><br /><searchLink fieldCode="AR" term="%22Lee%2C+Juwon%22">Lee, Juwon</searchLink><br /><searchLink fieldCode="AR" term="%22Lee%2C+Hyerin%22">Lee, Hyerin</searchLink><br /><searchLink fieldCode="AR" term="%22Choi%2C+Ujin%22">Choi, Ujin</searchLink><br /><searchLink fieldCode="AR" term="%22Kim%2C+Eojin%22">Kim, Eojin</searchLink><br /><searchLink fieldCode="AR" term="%22Jeong%2C+Minwoo%22">Jeong, Minwoo</searchLink><br /><searchLink fieldCode="AR" term="%22Lee%2C+Myoungjin%22">Lee, Myoungjin</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on. :019-021 Feb, 2026
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11454201
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ICAIIC68212.2026.11454201
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 019
    Titles:
      – TitleFull: Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Seo, Hyeona
      – PersonEntity:
          Name:
            NameFull: Kim, Geon
      – PersonEntity:
          Name:
            NameFull: Kim, Dongyeong
      – PersonEntity:
          Name:
            NameFull: Kim, Suyeon
      – PersonEntity:
          Name:
            NameFull: Park, Jewon
      – PersonEntity:
          Name:
            NameFull: Kim, Shinwook
      – PersonEntity:
          Name:
            NameFull: Kang, Ryun
      – PersonEntity:
          Name:
            NameFull: Kim, Sowon
      – PersonEntity:
          Name:
            NameFull: Lim, Chaehyuk
      – PersonEntity:
          Name:
            NameFull: Yun, Jeonghyeon
      – PersonEntity:
          Name:
            NameFull: Lee, Juwon
      – PersonEntity:
          Name:
            NameFull: Lee, Hyerin
      – PersonEntity:
          Name:
            NameFull: Choi, Ujin
      – PersonEntity:
          Name:
            NameFull: Kim, Eojin
      – PersonEntity:
          Name:
            NameFull: Jeong, Minwoo
      – PersonEntity:
          Name:
            NameFull: Lee, Myoungjin
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 24
              M: 02
              Type: published
              Y: 2026
          Identifiers:
            – Type: isbn-print
              Value: 9798331579579
            – Type: isbn-print
              Value: 9798331579586
            – Type: issn-print
              Value: 28316983
            – Type: issn-print
              Value: 28316991
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC), Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on
              Type: main
ResultId 1