Conference
Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions
| Τίτλος: | Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions |
|---|---|
| Συγγραφείς: | Seo, Hyeona, Kim, Geon, Kim, Dongyeong, Kim, Suyeon, Park, Jewon, Kim, Shinwook, Kang, Ryun, Kim, Sowon, Lim, Chaehyuk, Yun, Jeonghyeon, Lee, Juwon, Lee, Hyerin, Choi, Ujin, Kim, Eojin, Jeong, Minwoo, Lee, Myoungjin |
| Πηγή: | 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on. :019-021 Feb, 2026 |
| Relation: | 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331579579 9798331579586 |
|---|---|
| ISSN: | 28316983 28316991 |
| DOI: | 10.1109/ICAIIC68212.2026.11454201 |