Seo, H., Kim, G., Kim, D., Kim, S., Park, J., Kim, S., . . . Lee, M. (2026). Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions. 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC), Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on, 019. https://doi.org/10.1109/ICAIIC68212.2026.11454201
Παραπομπή σε μορφή Chicago (17η εκδ.)Seo, Hyeona, et al. "Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions." 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC), Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on 2026: 019. https://doi.org/10.1109/ICAIIC68212.2026.11454201.
Παραπομπή σε μορφή MLA (9th εκδ.)Seo, Hyeona, et al. "Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions." 2026 International Conference on Artificial Intelligence in Information and Communication (ICAIIC), Artificial Intelligence in Information and Communication (ICAIIC), 2026 International Conference on, 2026, p. 019, https://doi.org/10.1109/ICAIIC68212.2026.11454201.