Academic Journal

Markov Chain-Driven Asymmetric Dual-Beta Region Reconstruction Random SVPWM for High-Frequency Sideband Harmonic Suppression and Peak Frequency Band Control in PMSM Systems

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Τίτλος: Markov Chain-Driven Asymmetric Dual-Beta Region Reconstruction Random SVPWM for High-Frequency Sideband Harmonic Suppression and Peak Frequency Band Control in PMSM Systems
Συγγραφείς: Ruan, W., Chen, Y., Wang, R., Niu, S.
Πηγή: IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 14(5):6154-6169 Oct, 2026
Βάση Δεδομένων: IEEE Xplore Digital Library
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  – Url: https://resolver.ebsco.com/c/fiv2js/result?sid=EBSCO:edseee&genre=article&issn=21686777&ISBN=&volume=14&issue=5&date=20261001&spage=6154&pages=6154-6169&title=IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron.&atitle=Markov%20Chain-Driven%20Asymmetric%20Dual-Beta%20Region%20Reconstruction%20Random%20SVPWM%20for%20High-Frequency%20Sideband%20Harmonic%20Suppression%20and%20Peak%20Frequency%20Band%20Control%20in%20PMSM%20Systems&aulast=Ruan%2C%20W.&id=DOI:10.1109/JESTPE.2026.3676446
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11450083
RelevancyScore: 1163
AccessLevel: 2
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PubTypeId: academicJournal
PreciseRelevancyScore: 1162.99951171875
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Markov Chain-Driven Asymmetric Dual-Beta Region Reconstruction Random SVPWM for High-Frequency Sideband Harmonic Suppression and Peak Frequency Band Control in PMSM Systems
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Ruan%2C+W%2E%22">Ruan, W.</searchLink><br /><searchLink fieldCode="AR" term="%22Chen%2C+Y%2E%22">Chen, Y.</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+R%2E%22">Wang, R.</searchLink><br /><searchLink fieldCode="AR" term="%22Niu%2C+S%2E%22">Niu, S.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 14(5):6154-6169 Oct, 2026
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11450083
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/JESTPE.2026.3676446
    PhysicalDescription:
      Pagination:
        PageCount: 16
        StartPage: 6154
    Titles:
      – TitleFull: Markov Chain-Driven Asymmetric Dual-Beta Region Reconstruction Random SVPWM for High-Frequency Sideband Harmonic Suppression and Peak Frequency Band Control in PMSM Systems
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ruan, W.
      – PersonEntity:
          Name:
            NameFull: Chen, Y.
      – PersonEntity:
          Name:
            NameFull: Wang, R.
      – PersonEntity:
          Name:
            NameFull: Niu, S.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 21686777
            – Type: issn-print
              Value: 21686785
            – Type: issn-locals
              Value: edseee.IEEEJournals
          Numbering:
            – Type: volume
              Value: 14
            – Type: issue
              Value: 5
          Titles:
            – TitleFull: IEEE Journal of Emerging and Selected Topics in Power Electronics, Emerging and Selected Topics in Power Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Topics Power Electron.
              Type: main
ResultId 1