Academic Journal
Algorithm-Enabled Isolation of Intrinsic Characteristics and Random Telegraph Noise in High-Resolution ID − VG Data
| Title: | Algorithm-Enabled Isolation of Intrinsic Characteristics and Random Telegraph Noise in High-Resolution ID − VG Data |
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| Authors: | Varanasi, A., Higashi, Y., Roussel, P., Vandemaele, M., Saraza-Canflanca, P., Merckling, C., Degraeve, R. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(4):2378-2384 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2026.3667659 |