Zhu, Y., Bu, J., Jamal Deen, M., & Jiang, W. (2026). Verilog-A Modeling and Experimental Validation of Random Telegraph Signal Noise in Single-Photon Avalanche Diodes. IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, 73(3), 1467. https://doi.org/10.1109/TED.2026.3657327
Παραπομπή σε μορφή Chicago (17η εκδ.)Zhu, Y., J. Bu, M. Jamal Deen, και W. Jiang. "Verilog-A Modeling and Experimental Validation of Random Telegraph Signal Noise in Single-Photon Avalanche Diodes." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices 73, no. 3 (2026): 1467. https://doi.org/10.1109/TED.2026.3657327.
Παραπομπή σε μορφή MLA (9th εκδ.)Zhu, Y., et al. "Verilog-A Modeling and Experimental Validation of Random Telegraph Signal Noise in Single-Photon Avalanche Diodes." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, vol. 73, no. 3, 2026, p. 1467, https://doi.org/10.1109/TED.2026.3657327.