Gao, Y., & Xiao, T. (2025). A High-Dimensional Integer Linear Inequality System Fault-Tolerant Solving Algorithm for Side-Channel Protection Verification. 2025 5th International Conference on Electronic Materials and Information Engineering (EMIE), Electronic Materials and Information Engineering (EMIE), 2025 5th International Conference on, 126. https://doi.org/10.1109/EMIE67682.2025.11369327
Παραπομπή σε μορφή Chicago (17η εκδ.)Gao, Yingqi, και Tongcui Xiao. "A High-Dimensional Integer Linear Inequality System Fault-Tolerant Solving Algorithm for Side-Channel Protection Verification." 2025 5th International Conference on Electronic Materials and Information Engineering (EMIE), Electronic Materials and Information Engineering (EMIE), 2025 5th International Conference on 2025: 126. https://doi.org/10.1109/EMIE67682.2025.11369327.
Παραπομπή σε μορφή MLA (9th εκδ.)Gao, Yingqi, και Tongcui Xiao. "A High-Dimensional Integer Linear Inequality System Fault-Tolerant Solving Algorithm for Side-Channel Protection Verification." 2025 5th International Conference on Electronic Materials and Information Engineering (EMIE), Electronic Materials and Information Engineering (EMIE), 2025 5th International Conference on, 2025, p. 126, https://doi.org/10.1109/EMIE67682.2025.11369327.