Conference
A Data Hierarchy-Based Adaptive Testing Method for Integrated Circuit Parameter Sets
| Τίτλος: | A Data Hierarchy-Based Adaptive Testing Method for Integrated Circuit Parameter Sets |
|---|---|
| Συγγραφείς: | Hao, Kaiming, Li, Yan, Cheng, Xu, Wu, Qiong, Zhan, Wenfa, Huang, Yujie |
| Πηγή: | 2025 IEEE 16th International Conference on ASIC (ASICON) ASIC (ASICON), 2025 IEEE 16th International Conference on. :1-4 Oct, 2025 |
| Relation: | 2025 IEEE 16th International Conference on ASIC (ASICON) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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