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A Data Hierarchy-Based Adaptive Testing Method for Integrated Circuit Parameter Sets

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Τίτλος: A Data Hierarchy-Based Adaptive Testing Method for Integrated Circuit Parameter Sets
Συγγραφείς: Hao, Kaiming, Li, Yan, Cheng, Xu, Wu, Qiong, Zhan, Wenfa, Huang, Yujie
Πηγή: 2025 IEEE 16th International Conference on ASIC (ASICON) ASIC (ASICON), 2025 IEEE 16th International Conference on. :1-4 Oct, 2025
Relation: 2025 IEEE 16th International Conference on ASIC (ASICON)
Βάση Δεδομένων: IEEE Xplore Digital Library
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