Qiu, X., Fan, B., Wang, Y., Meng, W., & Yang, Q. (2026). Edge-Event-Based Distributed Resilient Control of DC Microgrid Against Multipattern Deception Attacks. IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron., 73(4), 6266-6276. https://doi.org/10.1109/TIE.2025.3634415
Παραπομπή σε μορφή Chicago (17η εκδ.)Qiu, X., B. Fan, Y. Wang, W. Meng, και Q. Yang. "Edge-Event-Based Distributed Resilient Control of DC Microgrid Against Multipattern Deception Attacks." IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron. 73, no. 4 (2026): 6266-6276. https://doi.org/10.1109/TIE.2025.3634415.
Παραπομπή σε μορφή MLA (9th εκδ.)Qiu, X., et al. "Edge-Event-Based Distributed Resilient Control of DC Microgrid Against Multipattern Deception Attacks." IEEE Transactions on Industrial Electronics, Industrial Electronics, IEEE Transactions on, IEEE Trans. Ind. Electron., vol. 73, no. 4, 2026, pp. 6266-6276, https://doi.org/10.1109/TIE.2025.3634415.