Conference
Using of Chernov Face Diagrams to Identify Incorrect Results of Experimental Research
| Τίτλος: | Using of Chernov Face Diagrams to Identify Incorrect Results of Experimental Research |
|---|---|
| Συγγραφείς: | Goonko, Andrew V., Kutovenko, Yakov S., Seroklinov, Gennady V. |
| Πηγή: | 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) Actual Problems of Electronic Instrument Engineering (APEIE), 2025 IEEE XVII International Scientific and Technical Conference on. :1-4 Nov, 2025 |
| Relation: | 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11289310 RelevancyScore: 1129 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1129.4404296875 |
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| Items | – Name: Title Label: Title Group: Ti Data: Using of Chernov Face Diagrams to Identify Incorrect Results of Experimental Research – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Goonko%2C+Andrew+V%2E%22">Goonko, Andrew V.</searchLink><br /><searchLink fieldCode="AR" term="%22Kutovenko%2C+Yakov+S%2E%22">Kutovenko, Yakov S.</searchLink><br /><searchLink fieldCode="AR" term="%22Seroklinov%2C+Gennady+V%2E%22">Seroklinov, Gennady V.</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) Actual Problems of Electronic Instrument Engineering (APEIE), 2025 IEEE XVII International Scientific and Technical Conference on. :1-4 Nov, 2025 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11289310 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/APEIE66761.2025.11289310 PhysicalDescription: Pagination: PageCount: 4 StartPage: 1 Titles: – TitleFull: Using of Chernov Face Diagrams to Identify Incorrect Results of Experimental Research Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Goonko, Andrew V. – PersonEntity: Name: NameFull: Kutovenko, Yakov S. – PersonEntity: Name: NameFull: Seroklinov, Gennady V. IsPartOfRelationships: – BibEntity: Dates: – D: 14 M: 11 Type: published Y: 2025 Identifiers: – Type: isbn-print Value: 9798331559168 – Type: isbn-print Value: 9798331559175 – Type: issn-print Value: 24738573 – Type: issn-print Value: 24738565 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE), Actual Problems of Electronic Instrument Engineering (APEIE), 2025 IEEE XVII International Scientific and Technical Conference on Type: main |
| ResultId | 1 |