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Observation of At-211 Incorporation Into Cells Expressing the Na-Iodide Symporter Using a High-Resolution Alpha-Particle Imaging System

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Τίτλος: Observation of At-211 Incorporation Into Cells Expressing the Na-Iodide Symporter Using a High-Resolution Alpha-Particle Imaging System
Συγγραφείς: Yoshino, M., Sugiyama, A., Tatsumi, T., Nomura, S., Shimazoe, K., Yamamoto, S., Taguchi, A., Tanaka, T., Kobayashi, M., Wada, Y., Kamada, K., Yoshikawa, A.
Πηγή: 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2025 IEEE. :1-1 Nov, 2025
Relation: 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Βάση Δεδομένων: IEEE Xplore Digital Library
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PubType: Conference
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  Data: Observation of At-211 Incorporation Into Cells Expressing the Na-Iodide Symporter Using a High-Resolution Alpha-Particle Imaging System
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  Data: 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2025 IEEE. :1-1 Nov, 2025
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  Data: 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
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RecordInfo BibRecord:
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        Value: 10.1109/NSS/MIC/RTSD57106.2025.11286378
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            – D: 01
              M: 11
              Type: published
              Y: 2025
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              Value: 9781665477673
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            – TitleFull: 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2025 IEEE
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