Sinha, A., Agrawal, A., & Das, D. (2026). Thermography-Based Electrical Machine Fault Diagnosis Using Explainable Compact Vision in Transformer. IEEE Journal of Emerging and Selected Topics in Industrial Electronics, Emerging and Selected Topics in Industrial Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Top. Ind. Electron., 7(3), 905. https://doi.org/10.1109/JESTIE.2025.3642206
Παραπομπή σε μορφή Chicago (17η εκδ.)Sinha, A., A. Agrawal, και D. Das. "Thermography-Based Electrical Machine Fault Diagnosis Using Explainable Compact Vision in Transformer." IEEE Journal of Emerging and Selected Topics in Industrial Electronics, Emerging and Selected Topics in Industrial Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Top. Ind. Electron. 7, no. 3 (2026): 905. https://doi.org/10.1109/JESTIE.2025.3642206.
Παραπομπή σε μορφή MLA (9th εκδ.)Sinha, A., et al. "Thermography-Based Electrical Machine Fault Diagnosis Using Explainable Compact Vision in Transformer." IEEE Journal of Emerging and Selected Topics in Industrial Electronics, Emerging and Selected Topics in Industrial Electronics, IEEE Journal of, IEEE J. Emerg. Sel. Top. Ind. Electron., vol. 7, no. 3, 2026, p. 905, https://doi.org/10.1109/JESTIE.2025.3642206.