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Accelerated Radiation Testing Method for Processor-based Computing Systems

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Τίτλος: Accelerated Radiation Testing Method for Processor-based Computing Systems
Συγγραφείς: Laurini, L. H., Ost, L., Cuenca-Asensi, S., Cheymol, B., Atukpor, E., Bastos, R. Possamai
Πηγή: 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2025 32nd IEEE International Conference on. :1-4 Nov, 2025
Relation: 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICECS66544.2025.11270682
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            NameFull: Bastos, R. Possamai
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              Y: 2025
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