Laurini, L. H., Ost, L., Cuenca-Asensi, S., Cheymol, B., Atukpor, E., & Bastos, R. P. (2025). Accelerated Radiation Testing Method for Processor-based Computing Systems. 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), Electronics, Circuits and Systems (ICECS), 2025 32nd IEEE International Conference on, 1. https://doi.org/10.1109/ICECS66544.2025.11270682
Παραπομπή σε μορφή Chicago (17η εκδ.)Laurini, L. H., L. Ost, S. Cuenca-Asensi, B. Cheymol, E. Atukpor, και R. Possamai Bastos. "Accelerated Radiation Testing Method for Processor-based Computing Systems." 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), Electronics, Circuits and Systems (ICECS), 2025 32nd IEEE International Conference on 2025: 1. https://doi.org/10.1109/ICECS66544.2025.11270682.
Παραπομπή σε μορφή MLA (9th εκδ.)Laurini, L. H., et al. "Accelerated Radiation Testing Method for Processor-based Computing Systems." 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), Electronics, Circuits and Systems (ICECS), 2025 32nd IEEE International Conference on, 2025, p. 1, https://doi.org/10.1109/ICECS66544.2025.11270682.