Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis
Συγγραφείς: Bensch, Aidan, Hammel, Melody, Lin, Lan
Πηγή: 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC) Electrics and Computer (INTCEC), 2025 Interdisciplinary Conference on. :1-8 Sep, 2025
Relation: 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/INTCEC65580.2025.11256117
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              Y: 2025
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