Conference
Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis
| Τίτλος: | Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis |
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| Συγγραφείς: | Bensch, Aidan, Hammel, Melody, Lin, Lan |
| Πηγή: | 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC) Electrics and Computer (INTCEC), 2025 Interdisciplinary Conference on. :1-8 Sep, 2025 |
| Relation: | 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331501693 |
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| DOI: | 10.1109/INTCEC65580.2025.11256117 |