Bensch, A., Hammel, M., & Lin, L. (2025). Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis. 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC), Electrics and Computer (INTCEC), 2025 Interdisciplinary Conference on, 1. https://doi.org/10.1109/INTCEC65580.2025.11256117
Παραπομπή σε μορφή Chicago (17η εκδ.)Bensch, Aidan, Melody Hammel, και Lan Lin. "Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis." 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC), Electrics and Computer (INTCEC), 2025 Interdisciplinary Conference on 2025: 1. https://doi.org/10.1109/INTCEC65580.2025.11256117.
Παραπομπή σε μορφή MLA (9th εκδ.)Bensch, Aidan, et al. "Augmenting Black-Box Unit Testing with Crafted Mockups and Code Coverage Analysis." 2025 Interdisciplinary Conference on Electrics and Computer (INTCEC), Electrics and Computer (INTCEC), 2025 Interdisciplinary Conference on, 2025, p. 1, https://doi.org/10.1109/INTCEC65580.2025.11256117.