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Automata Models for Effective Bug Pattern Description

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Title: Automata Models for Effective Bug Pattern Description
Authors: Yaacov, Tom, Weiss, Gera, Amram, Gal, Hayoun, Avi
Source: 2025 ACM/IEEE 28th International Conference on Model Driven Engineering Languages and Systems (MODELS) MODELS Model Driven Engineering Languages and Systems (MODELS), 2025 ACM/IEEE 28th International Conference on. :119-129 Oct, 2025
Relation: 2025 ACM/IEEE 28th International Conference on Model Driven Engineering Languages and Systems (MODELS)
Database: IEEE Xplore Digital Library
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DbLabel: IEEE Xplore Digital Library
An: edseee.11245297
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PubType: Conference
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/MODELS67397.2025.00017
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      Pagination:
        PageCount: 11
        StartPage: 119
    Titles:
      – TitleFull: Automata Models for Effective Bug Pattern Description
        Type: main
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            NameFull: Yaacov, Tom
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            NameFull: Weiss, Gera
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            NameFull: Amram, Gal
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            NameFull: Hayoun, Avi
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          Dates:
            – D: 05
              M: 10
              Type: published
              Y: 2025
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            – TitleFull: 2025 ACM/IEEE 28th International Conference on Model Driven Engineering Languages and Systems (MODELS), Model Driven Engineering Languages and Systems (MODELS), 2025 ACM/IEEE 28th International Conference on, MODELS
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