Conference

An End-to-End Simulator for Testing Array Processing Algorithms

Bibliographic Details
Title: An End-to-End Simulator for Testing Array Processing Algorithms
Authors: Saad-Falcon, Alex, Devarajaiah, Yashas, Wang, Wei-Chun, Sharma, Sudarshan, Mao, Xiangyu, Mukhopadhyay, Saibal, Romberg, Justin, Huang, Russ H., Molnar, Alyosha
Source: 2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2025 IEEE 68th International Midwest Symposium on. :543-547 Aug, 2025
Relation: 2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS)
Database: IEEE Xplore Digital Library
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DbLabel: IEEE Xplore Digital Library
An: edseee.11244559
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AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1116.80151367188
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: An End-to-End Simulator for Testing Array Processing Algorithms
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Saad-Falcon%2C+Alex%22">Saad-Falcon, Alex</searchLink><br /><searchLink fieldCode="AR" term="%22Devarajaiah%2C+Yashas%22">Devarajaiah, Yashas</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Wei-Chun%22">Wang, Wei-Chun</searchLink><br /><searchLink fieldCode="AR" term="%22Sharma%2C+Sudarshan%22">Sharma, Sudarshan</searchLink><br /><searchLink fieldCode="AR" term="%22Mao%2C+Xiangyu%22">Mao, Xiangyu</searchLink><br /><searchLink fieldCode="AR" term="%22Mukhopadhyay%2C+Saibal%22">Mukhopadhyay, Saibal</searchLink><br /><searchLink fieldCode="AR" term="%22Romberg%2C+Justin%22">Romberg, Justin</searchLink><br /><searchLink fieldCode="AR" term="%22Huang%2C+Russ+H%2E%22">Huang, Russ H.</searchLink><br /><searchLink fieldCode="AR" term="%22Molnar%2C+Alyosha%22">Molnar, Alyosha</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2025 IEEE 68th International Midwest Symposium on. :543-547 Aug, 2025
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11244559
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/MWSCAS53549.2025.11244559
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 543
    Titles:
      – TitleFull: An End-to-End Simulator for Testing Array Processing Algorithms
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Saad-Falcon, Alex
      – PersonEntity:
          Name:
            NameFull: Devarajaiah, Yashas
      – PersonEntity:
          Name:
            NameFull: Wang, Wei-Chun
      – PersonEntity:
          Name:
            NameFull: Sharma, Sudarshan
      – PersonEntity:
          Name:
            NameFull: Mao, Xiangyu
      – PersonEntity:
          Name:
            NameFull: Mukhopadhyay, Saibal
      – PersonEntity:
          Name:
            NameFull: Romberg, Justin
      – PersonEntity:
          Name:
            NameFull: Huang, Russ H.
      – PersonEntity:
          Name:
            NameFull: Molnar, Alyosha
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 10
              M: 08
              Type: published
              Y: 2025
          Identifiers:
            – Type: isbn-print
              Value: 9798331589349
            – Type: issn-print
              Value: 15583899
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2025 IEEE 68th International Midwest Symposium on Circuits and Systems (MWSCAS), Circuits and Systems (MWSCAS), 2025 IEEE 68th International Midwest Symposium on
              Type: main
ResultId 1