Conference

Closing the Gap: Advantages of Block-Level over Gate-Level in 3D IC Design for Advanced Nodes

Bibliographic Details
Title: Closing the Gap: Advantages of Block-Level over Gate-Level in 3D IC Design for Advanced Nodes
Authors: Park, Min Gyu, Vanna-Iampikul, Pruek, Lim, Sung Kyu
Source: 2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2025 IEEE/ACM International Conference On. :1-9 Oct, 2025
Relation: 2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
Database: IEEE Xplore Digital Library
Be the first to leave a comment!
You must be logged in first