Academic Journal
A Fast and Intelligent Monitoring of Solder Layer Degradation in Multichip IGBT Modules Based on Copper Substrate Temperature Field Reconstruction
| Τίτλος: | A Fast and Intelligent Monitoring of Solder Layer Degradation in Multichip IGBT Modules Based on Copper Substrate Temperature Field Reconstruction |
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| Συγγραφείς: | Du, X., Yang, Y., Lv, J., Wen, Y., Zou, S., Wang, Y., Cobreces, S. |
| Πηγή: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 41(4):4498-4504 Apr, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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