Academic Journal
Real-Time Thickness Monitoring for Enhanced Geometric Uniformity of REBCO CCs
| Τίτλος: | Real-Time Thickness Monitoring for Enhanced Geometric Uniformity of REBCO CCs |
|---|---|
| Συγγραφείς: | Park, I., Kim, G., Kim, J., Ha, H. |
| Πηγή: | IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 36(3):1-5 May, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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