Academic Journal

Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”

Bibliographic Details
Title: Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”
Authors: Li, H., Mehra, R.
Source: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 42(6):138-139 Dec, 2025
Database: IEEE Xplore Digital Library
Description
ISSN:21682356
21682364
DOI:10.1109/MDAT.2025.3605046