Li, H., & Mehra, R. (2025). Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”. IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, 42(6), 138. https://doi.org/10.1109/MDAT.2025.3605046
Παραπομπή σε μορφή Chicago (17η εκδ.)Li, H., και R. Mehra. "Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test 42, no. 6 (2025): 138. https://doi.org/10.1109/MDAT.2025.3605046.
Παραπομπή σε μορφή MLA (9th εκδ.)Li, H., και R. Mehra. "Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, vol. 42, no. 6, 2025, p. 138, https://doi.org/10.1109/MDAT.2025.3605046.