Conference
Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs
| Τίτλος: | Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs |
|---|---|
| Συγγραφείς: | Badalawa, Wasanthamala, Yoshitaka, Aoki, Hara, Tomoaki |
| Πηγή: | 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-4 Sep, 2025 |
| Relation: | 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11216956 RelevancyScore: 1117 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1116.81677246094 |
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| Items | – Name: Title Label: Title Group: Ti Data: Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Badalawa%2C+Wasanthamala%22">Badalawa, Wasanthamala</searchLink><br /><searchLink fieldCode="AR" term="%22Yoshitaka%2C+Aoki%22">Yoshitaka, Aoki</searchLink><br /><searchLink fieldCode="AR" term="%22Hara%2C+Tomoaki%22">Hara, Tomoaki</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-4 Sep, 2025 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11216956 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/THERMINIC65879.2025.11216956 PhysicalDescription: Pagination: PageCount: 4 StartPage: 1 Titles: – TitleFull: Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Badalawa, Wasanthamala – PersonEntity: Name: NameFull: Yoshitaka, Aoki – PersonEntity: Name: NameFull: Hara, Tomoaki IsPartOfRelationships: – BibEntity: Dates: – D: 24 M: 09 Type: published Y: 2025 Identifiers: – Type: isbn-print Value: 9798331594862 – Type: issn-print Value: 24741523 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on Type: main |
| ResultId | 1 |