Badalawa, W., Yoshitaka, A., & Hara, T. (2025). Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs. 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on, 1. https://doi.org/10.1109/THERMINIC65879.2025.11216956
Παραπομπή σε μορφή Chicago (17η εκδ.)Badalawa, Wasanthamala, Aoki Yoshitaka, και Tomoaki Hara. "Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs." 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on 2025: 1. https://doi.org/10.1109/THERMINIC65879.2025.11216956.
Παραπομπή σε μορφή MLA (9th εκδ.)Badalawa, Wasanthamala, et al. "Verification of Thermal Transient Measurement Methods for Cascode Type SiC JFETs." 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on, 2025, p. 1, https://doi.org/10.1109/THERMINIC65879.2025.11216956.