Du, Y., Jiang, M., Liu, Y., Zhuang, S., Liu, K., Tong, M., & Gao, H. (2026). NISP: State Transition-Driven Nonlinear Imputation for Dropout Recovery in scRNA-Seq Data. IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., 22(2), 740-750. https://doi.org/10.1109/TII.2025.3609178
Παραπομπή σε μορφή Chicago (17η εκδ.)Du, Y., M. Jiang, Y. Liu, S. Zhuang, K. Liu, M. Tong, και H. Gao. "NISP: State Transition-Driven Nonlinear Imputation for Dropout Recovery in ScRNA-Seq Data." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf. 22, no. 2 (2026): 740-750. https://doi.org/10.1109/TII.2025.3609178.
Παραπομπή σε μορφή MLA (9th εκδ.)Du, Y., et al. "NISP: State Transition-Driven Nonlinear Imputation for Dropout Recovery in ScRNA-Seq Data." IEEE Transactions on Industrial Informatics, Industrial Informatics, IEEE Transactions on, IEEE Trans. Ind. Inf., vol. 22, no. 2, 2026, pp. 740-750, https://doi.org/10.1109/TII.2025.3609178.