Ouedraogo, W. C., Li, Y., Dang, X., Zhou, X., Koyuncu, A., Klein, J., . . . Bissyande, T. F. (2025). Rethinking Cognitive Complexity for Unit Tests: Toward a Readability-Aware Metric Grounded in Developer Perception. 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME), Software Maintenance and Evolution (ICSME), 2025 IEEE International Conference on, ICSME, 797. https://doi.org/10.1109/ICSME64153.2025.00082
Παραπομπή σε μορφή Chicago (17η εκδ.)Ouedraogo, Wendkuuni C., Yinghua Li, Xueqi Dang, Xin Zhou, Anil Koyuncu, Jacques Klein, David Lo, και Tegawende F. Bissyande. "Rethinking Cognitive Complexity for Unit Tests: Toward a Readability-Aware Metric Grounded in Developer Perception." 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME), Software Maintenance and Evolution (ICSME), 2025 IEEE International Conference on, ICSME 2025: 797. https://doi.org/10.1109/ICSME64153.2025.00082.
Παραπομπή σε μορφή MLA (9th εκδ.)Ouedraogo, Wendkuuni C., et al. "Rethinking Cognitive Complexity for Unit Tests: Toward a Readability-Aware Metric Grounded in Developer Perception." 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME), Software Maintenance and Evolution (ICSME), 2025 IEEE International Conference on, ICSME, 2025, p. 797, https://doi.org/10.1109/ICSME64153.2025.00082.