Rack, M., Lederer, D., & Raskin, J. (2025). High-Resistivity Substrates in 22-nm FD-SOI—Part II: Impact on mm-Wave SPDT Performance. IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, 72(9), 5236. https://doi.org/10.1109/TED.2025.3593922
Παραπομπή σε μορφή Chicago (17η εκδ.)Rack, M., D. Lederer, και J. Raskin. "High-Resistivity Substrates in 22-nm FD-SOI—Part II: Impact on Mm-Wave SPDT Performance." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices 72, no. 9 (2025): 5236. https://doi.org/10.1109/TED.2025.3593922.
Παραπομπή σε μορφή MLA (9th εκδ.)Rack, M., et al. "High-Resistivity Substrates in 22-nm FD-SOI—Part II: Impact on Mm-Wave SPDT Performance." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, vol. 72, no. 9, 2025, p. 5236, https://doi.org/10.1109/TED.2025.3593922.