Academic Journal
High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses
| Τίτλος: | High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses |
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| Συγγραφείς: | Rack, M., Lederer, D., Raskin, J. |
| Πηγή: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(9):5229-5235 Sep, 2025 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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